
Si X-ray absorption near edge structure (XANES) of Si, SiC, SiO
1999年1月4日 · Silicon K X-ray emission spectra of Si, SiC, Si 3 N 4, and SiO 2 are measured using a wavelength dispersive electron probe X-ray microanalyzer. It is shown that the fine structures in the line shape of the low energy tail of the K α characteristic X-ray emission spectra resemble those of the K X-ray absorption near edge structure (XANES).
Silicon K-edge XANES spectra of silicate minerals
Silicon K-edge x-ray absorption near-edge structure (XANES) spectra of a selection of silicate and aluminosilicate minerals have been measured using synchrotron radiation (SR). The spectra are qualitatively interpreted based on MO calculation of the tetrahedral SiO 4− 4 cluster.
In situ X-ray spectroscopies beyond conventional X-ray absorption ...
2023年10月18日 · X-ray absorption spectroscopy (XAS) has become an indispensable tool to in situ investigate dynamic natures of electrocatalysts but still suffers from...
Si X-ray absorption near edge structure (XANES) of Si, SiC, SiO2, …
1999年1月4日 · It is shown that the fine structures in the line shape of the low energy tail of the Kα characteristic X-ray emission spectra resemble those of the K X-ray absorption near edge structure (XANES). XANES spectra of 1 μm 2 area can be obtained by this method.
XAFS判断价态的四种方法!! - 知乎专栏
X射线吸收光谱 (XAS)测量物质在X射线区域的入射光子能量 E 的透射率。 它具有元素特异性和轨道特异性,能够确定物质的局部原子和电子结构。 XAS能够推导出氧化态、态密度、配位、键长、热参数以及局部环境中的无序,原则上比其他技术更精确。 由于XAS不依赖于长程有序性,它特别适合研究具有局部短程有序的无序系统,例如玻璃、溶液、液体和非晶固体。 然而,它也可以应用于定义良好的甚至理想的晶体。 XAS可以确认其他技术提出的结构,或者基于纳米结构、 …
X射线“吸收光谱“知识 - 知乎 - 知乎专栏
随着 同步辐射光源 的建造,X射线吸收谱学方法(XAS)得到了前所未有的发展,在物质结构表征(包括原子结构及电子结构等)、理化性能解释(比如单原子催化剂位点研究、In-situ/operando测试等)都发挥着越来越重要的作用,前沿研究中都经常看见其身影。
XAS(同步辐射精细吸收谱)在表征活性位点中的应用 - 知乎
XAS(synchrotron X-ray absorption spectroscopy)以X射线光子能量作为变量,测定材料的X射线吸收系数。 每个吸收边与材料中存在的特定原子有关,更具体地说,与将特定原子核轨道电子激发到自由或未占据的连续谱水平(轨道的电离)的量子力学转变有关。
Na-, Al-, and Si K-edge XANES study of sodium silicate and …
2004年12月15日 · In this study, we explore the influence of the glass surface state on the local structure of network modifiers (Na) and formers (Al and Si) to determine the optimal conditions for collecting reliable XANES spectra at Na-, Al-, and Si K-edges in oxide glasses.
Normalized Si K -edge XANES spectra of c -Si (100), a -Si–C–N, c -Si…
The Si K -edge XANES and EXAFS measurements confirm the existence of a local tetrahedral C–Si–N 3 arrangement in the Si–C–N thin films.
In Situ X-ray Absorption Spectroscopy Studies of Nanoscale ...
2019年6月3日 · In situ X-ray absorption spectroscopy (XAS) has become a powerful technique to obtain oxidization states, electronic structure, and local coordination environment under reaction conditions.