5 天之前 · Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to …

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analytical technique that focuses a pulsed beam of primary ions onto a sample surface, producing secondary ions …

Time-of-Flight Secondary Ion Mass Spectrometry is a surface sensitive technique able to obtain both elemental composition and molecular information on a surface and in-depth. ToF-SIMS …

SIMS (Secondary Ion Mass Spectrometry) and TOF-SIMS (Time of Flight-SIMS) are the same in terms of mass analysis of secondary ions emitted by primary ion beam bombardment. They …

TOF-SIMS is a technique that can observe elemental, inorganic and molecular species present on the outermost surface of a sample, using a very small primary ion beam dose (~1e12 ions/cm …

TOF SIMS (secondary ion mass spectrometry) is enabled by focused ion beam FIB milling, providing high resolution elemental characterization.

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the …

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) provides elemental, chemical state, and molecular information from surfaces of solid materials. The average depth of analysis for a …

ToF-SIMS includes 5 ion beams, low energy electron flood gun and time-of-flight mass analyzer. It allows to characterize chemical composition with 100 nm lateral nm resolution on the surface …

The lateral distribution of chemical functionalities can be obtained by rastering the primary beam and the sample itself. ToF-SIMS is ideally suited for the analysis of polymers, or thiol self …