Angle resolved XPS (ARXPS) is a specialized technique for the nondestructive analysis of ultra-thin films, revealing thickness, composition, and chemical state.

Angle resolved X-ray photoelectron spectroscopy (ARXPS) is a technique to control the detection depth of a sample by changing the sample tilt angle with reference to the analyzer. Unlike …

Using angle resolved XPS (ARXPS), it is possible to characterize ultra-thin films without sputtering. In most cases, ARXPS can be considered to be a non-destructive technique. It …

2023年9月15日 · Strata PHI analysis of angle-resolved X-ray photoelectron spectroscopic (ARXPS) data is a non-destructive method to reconstruct relative depth information for various …

Angle resolved X-ray photoelectron spectroscopy determines the thickness and composition of thin coating films by measuring the attenuation of the electrons in the thin coating film as a …

X-ray photoelectron spectroscopy (XPS) and Ultraviolet photoelectron Spectroscopy (UPS) is used to analyze the surface chemistry of a material. XPS spectra are obtained by illuminating …

2022年8月28日 · X-Ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is one of the most widely used surface techniques in materials …

2009年1月1日 · An introductory mathematical review of some simple approaches to the interpretation of ARXPS data is given, with worked examples written in Mathematica.

Angle-resolved XPS (ARXPS) is a technique that varies the emission angle at which the electrons are collected, therefore enabling electron detection from different depths. Unlike sputter depth …

2006年3月29日 · Angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) is widely accepted as a useful tool for nondestructive in‐depth analysis of near surface regions.