The FIB-SIMS systems are designed to improve users’ operations, from routine detection tasks to complicated sample preparation. Nanoscale materials analysis cites an increasing domain of instruments ...

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Complementing these, the introduction of focused ion beam-secondary ion mass spectrometry (FIB-SIMS) adds a critical capability to the characterization toolkit, enabling highly sensitive and localized ...

The precision and speed of intelligent FIB scanning strategies for material removal can benefit users. Batches of samples, like TEM lamellae, cross-sections, or any user-defined pattern can be ...