Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...
If we define "robustness" as the ability to continue mission reliably despite the existence of systematic, random or malicious faults, how do you design fault-robust MCUs ...
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