AZoM on MSN1 个月
Why Offcut Angle Matters: Optimizing Ion Implantation for 4H-SiC Substrates
This method is appropriate for characterizing all common semiconductor substrates, such as SiC, Si, GaAs, InP, and GaN. Ion ...
Nanowerk9 个月
Focused Ion Beam Milling: Precision Nanofabrication at the Nanoscale
In some cases, a combination of techniques may be used to leverage the strengths of each method for optimal results. While FIB milling offers unique capabilities for nanofabrication, it also presents ...