Image Credit: Carl Zeiss Microscopy GmbH Cross-section ... Widefield, laser scanning and focussed ion beam scanning electron microscopy are all combined in the ZEISS Correlative Cryo Workflow in a ...
Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples. Get analytical ...
Stereoscan MK1, the first commercial SEM built in 1965 by the Cambridge Instrument Company. (Image: Carl Zeiss Microscopy) This instrument laid the groundwork for the modern Scanning Electron ...
ZEISS EVO series combines high definition Scanning Electron Microscopy with high throughput automated workflow. Experience excellence in extended pressure mode imaging, thanks to the latest ...
MultiSEM has been regulated with the proven ZEN imaging software and all of its options are arranged in an intuitive yet flexible method. The ZEISS MultiSEM 505 scanning electron microscope was ...
Equipped with the Gatan 3View system with the ability to obtain in situ 3D data at remarkably fine depth resolution by means of Serial Block-Face Scanning. Zeiss Crossbeam 550 with GEMINI II electron ...
The Ultra Plus scanning electron microscope is suitable for high-resolution imaging of biological and non-biological specimens. The microscope's charge compensation system allows non-conducting ...
More than 70 users of ZEISS electron and ion microscopes have already submitted their nano masterpieces to the first ever Carl Zeiss Nano Image Contest. Agar Scientific chose the RMS' biannual ...
The Ultra Plus scanning electron microscope is suitable for high-resolution imaging of biological and non-biological specimens. The microscope's charge compensation system allows non-conducting ...
The Zeiss Evo 15 is a user-friendly scanning electron microscope (SEM), located in LG45a of the Life Sciences Building, offering standard high vacuum, variable pressure and environmental modes. It is ...
In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face ...
The Microscopy Suite is home to a Scanning Electron Microscope (SEM) coupled with an Energy Dispersive X-ray spectroscopy system. The SEM is a Carl Zeiss EVO LS 15, equipped with a Peltier stage ...
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